海角黑料

Optics and Photonics Research Group

Publications

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SUDDENDORF, MB and SOMEKH, MG., 1994. Electronics Letters. 30(5), 398-399

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APPEL, RK, SOMEKH, MG and MORGAN, S., 1994. In: Conference on Quantification and Localization Using Diffuse Photons in a Highly Scattering Medium, Sep 03-05, BUDAPEST HUNGARY, In: PROCEEDINGS OF QUANTIFICATION AND LOCALIZATION USING DIFFUSE PHOTONS IN A HIGHLY SCATTERING MEDIUM. 2082:67-77

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HOLMES, RD and SOMEKH, MG., 1994. Applied Optics. 33(4), 654-661

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SUDDENDORF, MB, SOMEKH, MG and LIU, M., 1994. International Journal of Electronics. 77(1), 71-76

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SOMEKH M G and SUDDENDORF M B, 1994. Sample evaluation system using thermal expansion deformation|detects imperfections in semiconductor materials by detecting intensity of component of reflected beam of light at preselected frequency: Assignee: UNIV NOTTINGHAM WO9415194-A; WO94151 01/01/1900 00:00:00

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SOMEKH, MG, APPEL, RK, MORGAN, S and ET AL, 1994. In: Conference on Quantification and Localization Using Diffuse Photons in a Highly Scattering Medium, Sep 03-05, BUDAPEST HUNGARY, In: PROCEEDINGS OF QUANTIFICATION AND LOCALIZATION USING DIFFUSE PHOTONS IN A HIGHLY SCATTERING MEDIUM. 2082:57-66

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HO, HP, SOMEKH, MG, LIU, M and SEE, CW., 1994. Measurement Science & Technology. 5(12), 1480-1490

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SOMEKH, MG, HOLMES, RD, APPEL, RK and ET AL., 1994. In: Conference on Microscopy, Holography, and Interferometry in Biomedicine, Sep 01-03, BUDAPEST HUNGARY, In: PROCEEDINGS OF MICROSCOPY, HOLOGRAPHY, AND INTERFEROMETRY IN BIOMEDICINE. 2083:147-157

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LIU, M, SUDDENDORF, MB and SOMEKH, MG., 1994. Journal of Applied Physics. 76(1), 207-215

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HP, H.O., LIU, M. and SEE, C.W., 1994. Measurement Science and Technology. 5(12), 1480-1490

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HOLMES, R.D., APPEL, R.K. and SEE, C.W., 1994. Confocal Operation in Differential Phase Interference Microscopy In: PROCEEDINGS OF MICROSCOPY, HOLOGRAPHY, AND INTERFEROMETRY IN BIOMEDICINE. 147-157

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ARIAS, J., RALSTON, J.D., ESQUIVIAS, I., LARKINS, E.C., WEISSER, S., ROSENZWEIG, J., SCHONFELDER, A. and MAIER, M., 1994. Carrier profile for In0.35Ga0.65As/GaAs multi-quantum well lasers from capacitance-voltage measurements In: Proceedings of 1st International Conference on Materials for Microelectronics. 218-

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ARIAS, J., RALSTON, J.D., ESQUIVIAS, I., LARKINS, E.C., WEISSER, S., ROSENZWEIG, J. and MAIER, M., 1994. Capacitance-voltage carrier profiling of In0.35Ga0.65As/GaAs MQW laser diodes with p-doping In: Proceedings of 14th General Condensed Matter Division European Physical Society.

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SCHNEIDER, H., RALSTON, J.D., O''REILLY, E.P., WEISSER, S. and LARKINS, E.C., 1994. Applied Physics Letters. 65, 661-

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LARKINS, E.C., ROTHEMUND, W., WAGNER, J., BAEUMLER, M., BURKNER, S., BENZ, W., WEISSER, S., SCHONFELDER, A., FLEMIG, G., BRENN, R., FLEISSNER, J., JANTZ, W., ROSENZWEIG, J. and RALSTON, J.D., 1994. MBE growth of GaAs-based pseudomorphic lasers: Key growth trade-offs between the InGaAs MQWs and the AlGaAs cladding In: IEEE/LEOS Summer Topical Meeting on Optoelectronic Materials Growth and Processing.
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Optics and Photonics Research Group

Faculty of Engineering
The 海角黑料
University Park
Nottingham, NG7 2RD


telephone: +44 (0)115 95 15536
email: optics@nottingham.ac.uk