海角黑料

Optics and Photonics Research Group

Publications

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COLLISON, I.J., SHARPLES, S.D., CLARK, M. and SOMEKH, M.G., 2004. Adaptive correction for acoustic imaging in difficult materials In: REVIEW OF PROGRESS IN QUANTITATIVE NONDESTRUCTIVE EVALUATION, in Golden, CO, JUL 25-30, 2004. 1616-1621

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PITTER, M.C., SEE, C.W. and SOMEKH, M.G., 2004. Optics Letters. 29(11), 1200-1202

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STABLER, G., SOMEKH, M.G. and SEE, C.W., 2004. JOURNAL OF MICROSCOPY - OXFORD. 214(3), 328-333

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SEE, CW, SOMEKH, MG and PITTER MC., 2004. Image analysis method for measuring deformation of semiconductor chip, involves capturing two primary and two secondary images using microscope, where one primary and secondary images with best feature is selected by processor: Assignee: 海角黑料 WO2004010380-A3; WO2 01/01/1900 00:00:00

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VELINOV, T., BIVOLARSKA, M., RUSSEV, S., BRANSALOV, K. and SOMEKH, M., 2004. SENSORS AND ACTUATORS B-CHEMICAL. 100(3), 325-332

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WANG, R.K., TATAM, R.P. and SOMEKH, M., 2004. Biosensors & Bioelectronics. 20(3), 413-413

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SHARPLES, S.D., CLARK, M. and SOMEKH, M.G, 2004. Ultrasonics. 42(1-9), 647-651

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PITTER, MC, LIGHT, RA, SOMEKH, MG, CLARK, M and HAYES-GILL, BR., 2004. Electronics Letters. 40(22), 1404-1406

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SEE C W, SOMEKH M G and PITTER M C, 2004. Image analysis method for measuring deformation of semiconductor chip, involves capturing two primary and two secondary images using microscope, where one primary and secondary images with best feature is selected by processor: Assignee: UNIV NOTTINGHAM; SEE C W; SOMEKH M G; et al. WO2004010380-A3; WO2 01/01/1900 00:00:00

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WALKER, J. G., CHANG, P. C. Y., HOPCRAFT, K. I. and MOZAFFARI, E., 2004. Measurement Science and Technology. VOL 15(PART 5), 771-776

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BAKER, S. F., WALKER, J. G. and HOPCRAFT, K. I., 2004. Measurement Science and Technology. VOL 15(PART 3), 501-508

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STOCKFORD, I.M., MORGAN, S.P., CROWE, J.A. and WALKER, J.G., 2004. A polarized light imaging instrument for characterising skin lesions In: Optical Biopsy V, Proceedings of SPIE 5826. 82-91

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HOPCRAFT, K.I., CHANG, P.C.Y., JAKEMAN, E. and WALKER, J.G., 2004. Photopolarimetry in Remote Sensing. 161, 137-174

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JIANG, S.H. and WALKER, J.G., 2004. Optics Communications. 238(1-3), 1-12

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BORRUEL, L., SUJECKI, S., MORENO, P., WYKES, J., KRAKOWSKI, M., SUMPF, B., SEWELL, P., AUZANNEAU, S.C., WENZEL, H., RODRIGUEZ, D., BENSON, T.M., LARKINS, E.C. and ESQUIVIAS, I., 2004. IEEE Journal of Quantum Electronics. 40(5), 463-472
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Optics and Photonics Research Group

Faculty of Engineering
The 海角黑料
University Park
Nottingham, NG7 2RD


telephone: +44 (0)115 95 15536
email: optics@nottingham.ac.uk