海角黑料

Optics and Photonics Research Group

Publications

Content
SAWYER, NBE, SUDDENDORF, MB, SEE, CW and ET AL., 1996. A stable heterodyne scanning differential phase profilometer In: 4th Biennial Divisional Conference of the Applied-Optics-Division of the UK Institute-of-Physics - Applied Optics and Optoelectronics 1996, Sep 16-19, READING ENGLAND, In: APPLIED OPTICS AND OPTOELECTRONICS 1996. 104-109

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LIU, Y, SEE, CW and SOMEKH, MG., 1996. In: Conference on Optical Inspection and Micromeasurements, Jun 10-14, BESANCON FRANCE, In: OPTICAL INSPECTION AND MICROMEASUREMENTS. 2782:635-645

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SAWYER, NBE, SEE, CW and SOMEKH, MG., 1996. In: Conference on Optical Inspection and Micromeasurements, Jun 10-14, BESANCON FRANCE, In: OPTICAL INSPECTION AND MICROMEASUREMENTS. 2782:69-78

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LIU, YA, SEE, CW, SOMEKH, MG and ET AL., 1996. Micro-ellipsometric true topography In: 4th Biennial Divisional Conference of the Applied-Optics-Division of the UK Institute-of-Physics - Applied Optics and Optoelectronics 1996, Sep 16-19, READING ENGLAND, In: APPLIED OPTICS AND OPTOELECTRONICS 1996, pp.40-45.

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SAWYER, N.B.E. and SEE, C.W., 1996. Differential optical profilometer using a single probe beam. In: OPTICAL INSPECTION AND MICROMEASUREMENTS. 69-78

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LIU, Y.A., SEE, C.W. and HOLMES, R.D., 1996. Micro-ellipsometric true topography In: APPLIED OPTICS AND OPTOELECTRONICS 1996. 40-45

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SAWYER, N.B.E., SUDDENDORF, M.B. and SEE, C.W., 1996. A stable heterodyne scanning differential phase profilometer. In: APPLIED OPTICS AND OPTOELECTRONICS 1996. 104-109

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SCHUMACHER, K.L., SEE, C.W., LIU, Y.A. and OWEN, J.S., 1996. Photothermal induced refractive index variation for super-resolving for field optical imaging In: APPLIED OPTICS AND OPTOELECTRONICS 1996. 136-141

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PING, G.L., SEE, C.W., SUDDENDORF, M.B., VINCENT, J.H. and FOOTNER, P.K., 1996. A fast-scanning optical microscope for imaging magnetic domain structures Scanning. 18(1), 8-12

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GARSIDE, J.R. and SEE, C.W., 1996. A single probe beam fast laser scanning heterodyne differential phase confocal microscope for imaging live biological samples In: APPLIED OPTICS AND OPTOELECTRONICS 1996. 69-74

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SEE, C.W., 1996. Common path interferometric microellipsometry In: OPTICAL INSPECTION AND MICROMEASUREMENTS. 635-645

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PITTER, M.C. and WALKER, J.G., 1996. A comparison of the performance of spatial-filtering and time-of-flight imaging systems. In: APPLIED OPTICS AND OPTOELECTRONICS 1996. 131-135

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WOOD, C. and WALKER, J.G., 1996. Detecting intermittency in scattered light fields In: APPLIED OPTICS AND OPTOELECTRONICS 1996. 120-125

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SAH, R.E., RALSTON, J.D., DALEIDEN, J., LARKINS, E.C., WEISSER, S., FLEISSNER, J. and BENZ, W., 1996. Fabrication of dry-etched mirrors in GaAs-based and InP-based lasers using chemically assisted ion-beam etching at low temperatures Journal of Electronic Materials. 25, 1446-

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SCHNEIDER, H. and LARKINS, E. C., 1996. Solid-State Electronics. VOL 40(NUMBER 1/8), 133-138
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Optics and Photonics Research Group

Faculty of Engineering
The 海角黑料
University Park
Nottingham, NG7 2RD


telephone: +44 (0)115 95 15536
email: optics@nottingham.ac.uk